Published in
Cambridge University Press, Microscopy and Microanalysis, S3(22), p. 484-485, 2016
DOI: 10.1017/s1431927616003275
Links
Tools
Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors
Journal article published in 2016 by
Knut Müller-Caspary,
Florian F. Krause,
Armand Béché,
Martial Duchamp,
Marco Schowalter,
Stefan Löffler 
,
Vadim Migunov,
Florian Winkler,
Martin Huth,
Robert Ritz,
Sebastian Ihle,
Martin Simson,
Henning Ryll,
Heike Soltau,
Lothar Strüder
and other authors.
,
Vadim Migunov,
Florian Winkler,
Martin Huth,
Robert Ritz,
Sebastian Ihle,
Martin Simson,
Henning Ryll,
Heike Soltau,
Lothar Strüder
and other authors.
This paper is made freely available by the publisher.
Full text: Download
Postprint:
archiving forbidden
Published version:
archiving forbidden
Data provided by 