Published in
IOP Publishing, Journal of Physics: Conference Series, (849), p. 012032, 2017
DOI: 10.1088/1742-6596/849/1/012032
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Ptychographic imaging for the characterization of X-ray free-electron laser beams
Journal article published in 2017 by
S. Sala,
Bj Daurer 
,
Mf Hantke,
T. Ekeberg,
Nd Loh ,
Frnc Maia,
P. Thibault
,
Mf Hantke,
T. Ekeberg,
Nd Loh ,
Frnc Maia,
P. Thibault
This paper is made freely available by the publisher.
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