Published in
American Institute of Physics, Journal of Applied Physics, 6(120), p. 065106
DOI: 10.1063/1.4960701
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On twin density and resistivity of nanometric Cu thin films
Journal article published in 2016 by
Katayun Barmak 
,
Xuan Liu,
Amith Darbal,
N. Thomas Nuhfer,
Dooho Choi,
Tik Sun,
Andrew P. Warren,
Kevin R. Coffey,
Michael F. Toney
,
Xuan Liu,
Amith Darbal,
N. Thomas Nuhfer,
Dooho Choi,
Tik Sun,
Andrew P. Warren,
Kevin R. Coffey,
Michael F. Toney
This paper is made freely available by the publisher.
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