Published in

Elsevier, Acta Materialia, (115), p. 35-44, 2016

DOI: 10.1016/j.actamat.2016.05.039

Links

Tools

Export citation

Search in Google Scholar

Synchrotron high energy X-ray diffraction study of microstructure evolution of severely cold drawn NiTi wire during annealing

This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

Full text: Download

Green circle
Preprint: archiving allowed
Orange circle
Postprint: archiving restricted
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO