Characterization of voids in shock-loaded Al single crystal by combining X-ray tomography and electron microscopy

IOP Publishing, IOP Conference Series: Materials Science and Engineering, (219), p. 012027, 2017

Journal article published in 2017 by Chuanshi Hong, Søren Fæster, Niels Hansen, Xiaoxu Huang

, Rozaliya I. Barabash

This paper is made freely available by the publisher.

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