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European Microscopy Congress 2016: Proceedings, p. 511-512

DOI: 10.1002/9783527808465.emc2016.6213

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Atom-Resolved STEM Imaging Using a Segmented Detector

Entry published in 2016 by Takehito Seki, Gabriel Sanchez-Santolino ORCID, Nathan Lugg, Ryo Ishikawa, Scott D. Findlay, Yuichi Ikuhara, Naoya Shibata
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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