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American Institute of Physics, Journal of Applied Physics, 16(123), p. 161528

DOI: 10.1063/1.4997356

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Identification of F impurities in F-doped ZnO by synchrotron X-ray absorption near edge structures

Journal article published in 2018 by Sutassana Na-Phattalung ORCID, Sukit Limpijumnong, Chul-Hee Min, Deok-Yong Cho, Seung-Ran Lee, Kookrin Char ORCID, Jaejun Yu ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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