Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Nanotechnology, 6(16), p. 991-998, 2017
DOI: 10.1109/tnano.2017.2725383
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Interferometer Scanning Microwave Microscopy: Performance Evaluation
Journal article published in 2017 by
Silviu-Sorin Tuca 
,
Manuel Kasper,
Ferry Kienberger ,
Georg Gramse
,
Manuel Kasper,
Ferry Kienberger ,
Georg Gramse
This paper was not found in any repository, but could be made available legally by the author.
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