Published in
American Institute of Physics, Journal of Applied Physics, 10(122), p. 105302
DOI: 10.1063/1.4990135
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Bunches of misfit dislocations on the onset of relaxation of Si0.4Ge0.6/Si(001) epitaxial films revealed by high-resolution x-ray diffraction
Journal article published in 2017 by
Vladimir Kaganer,
Tatjana Ulyanenkova,
Andrei Benediktovitch,
Maksym Myronov 
,
Alex Ulyanenkov
,
Alex Ulyanenkov
This paper is available in a repository.
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