Published in
MAIK Nauka/Interperiodica, Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 4(10), p. 742-747
DOI: 10.1134/s1027451016040091
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The effect of silicon-substrate orientation on the local piezoelectric characteristics of LiNbO3 films
Journal article published in 2016 by
D. A. Kiselev,
R. N. Zhukov,
S. V. Ksenich,
I. V. Kubasov,
A. A. Temirov,
N. G. Timushkin,
A. S. Bykov,
M. D. Malinkovich,
V. V. Shvartsman,
D. C. Lupascu 
,
Y.-U. N. Parkhomenko
,
Y.-U. N. Parkhomenko
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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