Published in

Society of Photo-optical Instrumentation Engineers, Proceedings of SPIE, 2017

DOI: 10.1117/12.2267193

Links

Tools

Export citation

Search in Google Scholar

Automatic optical inspection of regular grid patterns with an inspection camera used below the Shannon-Nyquist criterion for optical resolution

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Red circle
Preprint: archiving forbidden
Green circle
Postprint: archiving allowed
Green circle
Published version: archiving allowed
Data provided by SHERPA/RoMEO