Published in
American Institute of Physics, Biointerphases, 2(11), p. 029603, 2016
DOI: 10.1116/1.4948341
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XPS depth profiling of an ultrathin bioorganic film with an argon gas cluster ion beam
Journal article published in 2016 by
Paul M. Dietrich 
,
Carolin Nietzold,
Matthias Weise,
Wolfgang E. S. Unger,
Saad Alnabulsi,
John Moulder
,
Carolin Nietzold,
Matthias Weise,
Wolfgang E. S. Unger,
Saad Alnabulsi,
John Moulder
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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