Understanding charge traps for optimizing Si-passivated Ge nMOSFETs
Proceedings article published in 2016 by
P. Ren,
R. Gao,
Z. Ji,
H. Arimura,
J. F. Zhang 
,
R. Wang,
M. Duan,
W. Zhang ,
J. Franco,
S. Sioncke,
D. Cott,
J. Mitard,
L. Witters,
H. Mertens,
B. Kaczer
and other authors.
,
R. Wang,
M. Duan,
W. Zhang ,
J. Franco,
S. Sioncke,
D. Cott,
J. Mitard,
L. Witters,
H. Mertens,
B. Kaczer
and other authors.
This paper is available in a repository.
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