Published in

Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 10(63), p. 3830-3836, 2016

DOI: 10.1109/ted.2016.2597540

Links

Tools

Export citation

Search in Google Scholar

A Comparative Study of Defect Energy Distribution and Its Impact on Degradation Kinetics in GeO2/Ge and SiON/Si pMOSFETs

Journal article published in 2016 by Jigang Ma, Wei Dong Zhang ORCID, Jian Fu Zhang ORCID, Brahim Benbakhti ORCID, Zhigang Ji, Jerome Mitard, Hiroaki Arimura
This paper is available in a repository.
This paper is available in a repository.

Full text: Download

Green circle
Preprint: archiving allowed
Upload
Green circle
Postprint: archiving allowed
Upload
Red circle
Published version: archiving forbidden
Policy details
Data provided by SHERPA/RoMEO