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Microscopy of Semiconducting Materials 2003, p. 163-166, 2018

DOI: 10.1201/9781351074636-38

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Advanced TEM analysis of strain-balanced Si/SiGe resonant tunnelling diode structures

Book chapter published in 2003 by Ack C. K. Chang, Dj J. Norris, Ag G. Cullis, Dj J. Paul ORCID, Pa Midgley
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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