Published in
Elsevier, Thin Solid Films, (611), p. 101-106, 2016
DOI: 10.1016/j.tsf.2016.05.014
Links
Tools
On the use of MEIS cartography for the determination of Si1–xGex thin-film strain
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Published version:
archiving forbidden
Data provided by 