Published in
Journal of the Society for Information Display, 2(25), p. 98-107
DOI: 10.1002/jsid.531
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Experimental decomposition of the positive bias temperature stress-induced instability in self-aligned coplanar InGaZnO thin-film transistors and its modeling based on the multiple stretched-exponential functions: Decomposition of the PBTS instability in IGZO TFTs
Journal article published in 2017 by
Dae Hwan Kim 
,
Sungju Choi,
Juntae Jang,
Hara Kang,
Dong Myong Kim,
Sung-Jin Choi,
Yong-Sung Kim,
Saeroonter Oh,
Ju Heyuck Baeck,
Jong Uk Bae,
Kwon-Shik Park,
Soo Young Yoon,
In Byeong Kang
,
Sungju Choi,
Juntae Jang,
Hara Kang,
Dong Myong Kim,
Sung-Jin Choi,
Yong-Sung Kim,
Saeroonter Oh,
Ju Heyuck Baeck,
Jong Uk Bae,
Kwon-Shik Park,
Soo Young Yoon,
In Byeong Kang
This paper is made freely available by the publisher.
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