Published in
American Institute of Physics, Review of Scientific Instruments, 2(88), p. 025105
DOI: 10.1063/1.4974847
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In situ electrical resistivity measurements of vanadium thin films performed in vacuum during different annealing cycles
Journal article published in 2017 by
Paulo Pedrosa 
,
Jean-Marc Cote,
Nicolas Martin ,
Mohammad Arab Pour Yazdi,
Alain Billard
,
Jean-Marc Cote,
Nicolas Martin ,
Mohammad Arab Pour Yazdi,
Alain Billard
This paper was not found in any repository, but could be made available legally by the author.
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