Published in
American Institute of Physics, Applied Physics Letters, 12(110), p. 121905, 2017
DOI: 10.1063/1.4978870
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Observation of individual stacking faults in GaN microcrystals by x-ray nanodiffraction
Journal article published in 2017 by
V. Holý,
D. Kriegner 
,
A. Lesnik,
J. Bläsing,
M. Wieneke,
A. Dadgar ,
P. Harcuba
,
A. Lesnik,
J. Bläsing,
M. Wieneke,
A. Dadgar ,
P. Harcuba
This paper was not found in any repository, but could be made available legally by the author.
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