Published in
Springer Verlag, JOM Journal of the Minerals, Metals and Materials Society, 2(69), p. 225-226
DOI: 10.1007/s11837-016-2208-3
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Advanced Characterization of Interfaces and Thin Films
Journal article published in 2016 by
Ritesh Sachan 
,
Vikas Tomar
,
Vikas Tomar
This paper was not found in any repository, but could be made available legally by the author.
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