Published in
Elsevier, Ultramicroscopy, (178), p. 38-47, 2017
DOI: 10.1016/j.ultramic.2016.07.016
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Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe 2
Journal article published in 2017 by
Florian Winkler,
Amir H. Tavabi 
,
Juri Barthel,
Martial Duchamp,
Emrah Yucelen,
Sven Borghardt,
Beata E. Kardynal,
Rafal E. Dunin-Borkowski
,
Juri Barthel,
Martial Duchamp,
Emrah Yucelen,
Sven Borghardt,
Beata E. Kardynal,
Rafal E. Dunin-Borkowski
This paper is made freely available by the publisher.
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