Published in
American Institute of Physics, Applied Physics Letters, 14(109), p. 141906
DOI: 10.1063/1.4964384
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Oxygen vacancy-driven evolution of structural and electrical properties in SrFeO3−δ thin films and a method of stabilization
Journal article published in 2016 by
Erik Enriquez 
,
Aiping Chen ,
Zach Harrell,
Xujie Lü,
Paul Dowden,
Nicholas Koskelo,
Marc Janoschek ,
Chonglin Chen,
Quanxi Jia
,
Aiping Chen ,
Zach Harrell,
Xujie Lü,
Paul Dowden,
Nicholas Koskelo,
Marc Janoschek ,
Chonglin Chen,
Quanxi Jia
This paper is made freely available by the publisher.
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