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Microscopy of Semiconducting Materials 2003, p. 1-10, 2018

DOI: 10.1201/9781351074636-1

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Exploring the limits of transistor scaling with electron microscopy

Journal article published in 2004 by David A. Muller ORCID, Frieder H. Baumann, Paul M. Voyles ORCID, G. D. Wilk
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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