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IOP Publishing, IOP Conference Series: Materials Science and Engineering, (169), p. 012010, 2017

DOI: 10.1088/1757-899x/169/1/012010

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A Deeper Insight into (Lu,Y)AG:Pr Scintillator Crystals

Journal article published in 2017 by Winicjusz Drozdowski ORCID, A. J. Wojtowicz, K. Brylew, W. Łachmański, E. Talik, M. Szubka, J. Kusz, A. Guzik, K. Balin, J. Kisielewski, M. Świrkowicz, A. Pajączkowska
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

Interior of Czochralski-grown (Lu,Y)AG:Pr crystals has been examined by means of several techniques, such as X-Ray Photoelectron Spectroscopy, X-Ray Diffraction, Time-of-Flight Secondary Ion Mass Spectrometry, and magnetic susceptibility measurements. Additionally, their luminescence has been monitored at various combinations of a double-beam (X-ray/IR) excitation.