The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction
Journal article published in 2017 by
C. M. Fancher 
,
S. Brewer,
C. C. Chung,
S. Röhrig,
T. Rojac,
G. Esteves,
M. Deluca,
N. Bassiri-Gharb,
J. L. Jones
,
S. Brewer,
C. C. Chung,
S. Röhrig,
T. Rojac,
G. Esteves,
M. Deluca,
N. Bassiri-Gharb,
J. L. Jones
