The Electrochemical Society, ECS Transactions, 2(25), p. 2397-2402, 2009
DOI: 10.1149/1.3205793
Full text: Unavailable
The polarization resistance of La0.6Sr0.4CoO3-δ thin film electrodes prepared via pulsed laser deposition (PLD) is investigated by impedance spectroscopy for various film deposition temperatures. The electrodes were deposited on yttria stabilized zirconia (YSZ) single crystals and polycrystals and on polycrystalline gadolinia doped ceria (CGO). Structure-property relations emphasizing the correlation between crystallinity and performance are determined by additional XRD, SEM and TEM measurements. These experiments revealed that thin film electrodes of extraordinary low polarization resistance and little degradation may be produced on YSZ by optimizing the deposition conditions.