Published in
World Scientific Publishing, Series on Advances in Mathematics for Applied Sciences, p. 32-36
DOI: 10.1142/9789812839527_0006
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Virtual Atomic Force Microscope as a Tool for Nanometrology
Book chapter published in 2009 by
V. S. Bormashov,
A. S. Baturin,
A. V. Zablotskiy,
R. V. Goldshtein,
K. B. Ustinov
This paper was not found in any repository, but could be made available legally by the author.
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