Sub-micron resolution high-speed spectral domain optical coherence tomography in quality inspection for printed electronics
Proceedings article published in 2012 by
J. Czajkowski 
,
J. Lauri,
R. Sliz,
P. Fält,
T. Fabritius,
R. Myllylä,
B. Cense
,
J. Lauri,
R. Sliz,
P. Fält,
T. Fabritius,
R. Myllylä,
B. Cense
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