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Optoelectronics, Materials, and Devices for Communications

DOI: 10.1117/12.445005

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Dependence of threshold current density on the stacked quantum dot layers

Proceedings article published in 2001 by Yongqiang Ning, Xin Gao, Yun Liu, Lijun Wang, Peter M. Smowton ORCID, Peter Blood
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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