Published in
Metrology, Inspection, and Process Control for Microlithography XV
DOI: 10.1117/12.436728
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Electric force microscopy with a single carbon nanotube tip
Proceedings article published in 2001 by
John A. Dagata,
F. S. S. Chien 
,
S. Gwo,
K. Morimoto,
Takahito Inoue,
J. Itoh,
Hiroshi Yokoyama
,
S. Gwo,
K. Morimoto,
Takahito Inoue,
J. Itoh,
Hiroshi Yokoyama
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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