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Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III
DOI: 10.1117/12.2020261
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A new method of determination of ablation threshold contour in the spot of focused XUV laser beam of nanosecond duration
Proceedings article published in 2013 by
Karel Kolacek,
Jiri Schmidt,
Jaroslav Straus,
Oleksandr Frolov,
Václav Prukner,
Radek Melich,
Andrei Choukourov 
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