Segmented-channel Si1−xGex/Si pMOSFET for improved ION and reduced variability
Proceedings article published in 2012 by
Byron Ho,
Nuo Xu,
Bingxi Wood,
Vinh Tran,
Saurabh Chopra,
Yihwan Kim,
Bich-Yen Nguyen,
Olivier Bonnin,
Carlos Mazure,
Satheesh Kuppurao,
Chorng-Ping Chang,
Tsu-Jae King Liu
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