Published in
2008 IEEE Silicon Nanoelectronics Workshop
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Single shot measurement in silicon single electron transistors
Proceedings article published in 2008 by
T. Ferrus 
,
D. A. Williams,
D. G. Hasko,
L. Creswell,
R. J. Collier,
A. Lam,
Q. R. Morrissey,
S. R. Burge,
M. J. French,
G. A. D. Briggs
,
D. A. Williams,
D. G. Hasko,
L. Creswell,
R. J. Collier,
A. Lam,
Q. R. Morrissey,
S. R. Burge,
M. J. French,
G. A. D. Briggs
This paper was not found in any repository, but could be made available legally by the author.
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