Published in
2011 12th European Conference on Radiation and Its Effects on Components and Systems
DOI: 10.1109/radecs.2011.6131402
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Combined use of heavy ion and proton test data in the determination of a GaAs Power MESFET critical charge and sensitive depth
Proceedings article published in 2011 by
Ruben Garcia,
Eamonn J. Daly,
Hugh D. R. Evans,
Petteri Nieminen,
Giovanni Santin 
,
Brian D. Sierawski,
Marcus H. Mendenhall
,
Brian D. Sierawski,
Marcus H. Mendenhall
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