Published in
Institute of Electrical and Electronics Engineers, IEEE Journal of the Electron Devices Society, 1(4), p. 15-21, 2016
DOI: 10.1109/jeds.2015.2502760
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- Institute of Electrical and Electronics Engineers
- [researchonline.ljmu.ac.uk] | PDF
- [researchonline.ljmu.ac.uk] | PDF
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Impact of Hot Carrier Aging on Random Telegraph Noise and Within a Device Fluctuation
Journal article published in 2016 by
Azrif B. Manut,
Jian Fu Zhang 
,
Meng Duan,
Zhigang Ji,
Wei Dong Zhang ,
Ben Kaczer,
Tom Schram,
Naoto Horiguchi,
Guido Groeseneken
,
Meng Duan,
Zhigang Ji,
Wei Dong Zhang ,
Ben Kaczer,
Tom Schram,
Naoto Horiguchi,
Guido Groeseneken
This paper is made freely available by the publisher.
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