Published in
2014 IEEE International Reliability Physics Symposium
DOI: 10.1109/irps.2014.6861147
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Defect density evaluation in a high-k MOSFET gate stack combining experimental and modeling methods
Proceedings article published in 2014 by
F. M. Puglisi,
D. Veksler,
K. Matthews,
G. Bersuker,
L. Larcher,
A. Padovani,
L. Vandelli,
P. Pavan 
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