Published in
2012 IEEE International Reliability Physics Symposium (IRPS)
DOI: 10.1109/irps.2012.6241852
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Challenges for introducing Ge and III/V devices into CMOS technologies
Proceedings article published in 2012 by
M. Heyns,
A. Alian,
G. Brammertz 
,
M. Caymax,
G. Eneman,
J. Franco ,
F. Gencarelli,
G. Groeseneken,
G. Hellings,
A. Hikavyy,
M. Houssa ,
B. Kaczer,
D. Lin,
R. Loo,
C. Merckling
and other authors.
,
M. Caymax,
G. Eneman,
J. Franco ,
F. Gencarelli,
G. Groeseneken,
G. Hellings,
A. Hikavyy,
M. Houssa ,
B. Kaczer,
D. Lin,
R. Loo,
C. Merckling
and other authors.
This paper was not found in any repository, but could be made available legally by the author.
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