Published in
2010 IEEE International Reliability Physics Symposium
DOI: 10.1109/irps.2010.5488743
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Role of holes and electrons during erase of TANOS memories: Evidences for dipole formation and its impact on reliability
Proceedings article published in 2010 by
Luca Vandelli,
Andrea Padovani,
Luca Larcher,
Antonio Arreghini,
Geert Van den bosch,
Malgorzata Jurczak,
Jan Van Houdt,
Vincenzo Della Marca,
Paolo Pavan 
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