Published in
2014 IEEE 6th International Memory Workshop (IMW)
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Origin of the deep reset and low variability of pulse-programmed W\Al2O3\TiW\Cu CBRAM device
Proceedings article published in 2014 by
A. Belmonte,
R. Degraeve,
A. Fantini,
W. Kim,
M. Houssa 
,
M. Jurczak,
L. Goux
,
M. Jurczak,
L. Goux
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