Published in
2010 IEEE International Memory Workshop
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Charge loss in TANOS devices caused by Vt sensing measurements during retention
Proceedings article published in 2010 by
H. Park,
G. Bersuker,
D. Gilmer,
K. Y. Lim,
M. Jo,
H. Hwang,
A. Padovani,
L. Larcher,
P. Pavan 
,
W. Taylor,
P. D. Kirsch
,
W. Taylor,
P. D. Kirsch
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