Published in
2007 IEEE International Electron Devices Meeting
DOI: 10.1109/iedm.2007.4418954
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Reliability of Enhancement-mode AlGaN/GaN HEMTs Fabricated by Fluorine Plasma Treatment
Proceedings article published in 2007 by
Congwen Yi,
Ruonan Wang,
Wei Huang,
Wilson C.-W. Tang,
K. M. Lau,
Kevin J. Chen 
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