Published in
2009 35th Annual Conference of IEEE Industrial Electronics
DOI: 10.1109/iecon.2009.5414846
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Yarn parameterization correlation using optical and capacitive sensors approaches
Proceedings article published in 2009 by
Vitor Carvalho,
Michael Belsley 
,
Rosa M. Vasconcelos,
Filomena O. Soares
,
Rosa M. Vasconcelos,
Filomena O. Soares
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