Published in
2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology
DOI: 10.1109/icsict.2012.6466679
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Performance and reliability of a 65nm Flash based FPGA
Proceedings article published in 2012 by
James Yingbo Jia,
Pavan Singaraju,
Fethi Dhaoui,
Rich Newell,
Patty Liu,
Habtom Micael,
Michael Traas,
Salim Sammie,
Frank Hawley,
John McCollum,
Van den Abeelen Werner
This paper was not found in any repository, but could be made available legally by the author.
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