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Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005.
DOI: 10.1109/icmts.2005.1452247
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MOSFET matching improvement in 65nm technology providing gain on both analog and SRAM performances
Proceedings article published in 2005 by
R. Difrenza,
K. Rochereau,
T. Devoivre,
B. Tavel,
B. Duriez,
D. Roy,
S. Jullian,
A. Dezzani,
R. Boulestin,
P. Stolk,
F. Arnaud
This paper was not found in any repository, but could be made available legally by the author.
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