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2014 IEEE International Conference on Image Processing (ICIP)

DOI: 10.1109/icip.2014.7025724

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Feature-based registration for correlative light and electron microscopy images

Proceedings article published in 2014 by David Nam, Judith Mantell, Lorna Hodgson, David Bull, Paul Verkade, Alin Achim
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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