Published in
EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems
DOI: 10.1109/esime.2008.4525105
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Modeling and characterization of interfaces — from an atomistic description to a continuum approach
Proceedings article published in 2008 by
Jianmin Qu,
Remi Dingreville 
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