Published in
2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC)
DOI: 10.1109/edssc.2009.5394217
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Progressive-degradation and breakdown of W-La2O3 MOS structures after constant voltage stress
Proceedings article published in 2009 by
J. Molina,
C. Zuniga,
E. Gutierrez,
A. Jacome,
W. Calleja,
F. J. De La Hidalga,
P. Rosales,
C. Zuiga,
R. Torres 
,
H. Iwai
,
H. Iwai
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