Published in
The Eighth International Conference on Advanced Semiconductor Devices and Microsystems
DOI: 10.1109/asdam.2010.5667017
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Simulation of a planar micro Ion Mobility Spectrometer for security applications
Proceedings article published in 2010 by
R. Cumeras,
I. Gracia,
E. Figueras,
L. Fonseca,
J. Santander 
,
M. Salleras,
C. Calaza,
N. Sabate,
C. Cane
,
M. Salleras,
C. Calaza,
N. Sabate,
C. Cane
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