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Carl Hanser Verlag, International Journal of Materials Research, 1(101), p. 21-26

DOI: 10.3139/146.110244

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Applications of aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy to thin oxide films and interfaces

Journal article published in 2010 by Maria Varela ORCID, Jaume Gazquez, Andy R. Lupini, Julia T. Luck, Maria A. Torija, Manish Sharma, Chris Leighton, Mike D. Biegalski, Hans M. Christen, Matt Murfitt, Niklas Dellby, Ondrej Krivanek, Stephen J. Pennycook
Distributing this paper is prohibited by the publisher
Distributing this paper is prohibited by the publisher

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