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American Institute of Physics, APL Materials, 8(4), p. 086105, 2016

DOI: 10.1063/1.4960621

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Ferroelectric domains in epitaxial PbxSr1-xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy

Journal article published in 2016 by S. Fernandez-Pena, C. Lichtensteiger ORCID, P. Zubko, C. Weymann, S. Gariglio ORCID, J.-M. Triscone
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

We present a detailed study of compressively strained PbxSr1−xTiO3 thin films grown by off-axis radio frequency magnetron sputtering on (001)-oriented Nb-doped SrTiO3 substrates. Film tetragonality and the ferroelectric critical temperatures are measured for samples of different composition and thickness and compared with a phenomenological Landau-Devonshire model. 180∘ ferroelectric domains are observed using both X-ray diffraction and piezoresponse force microscopy and domain sizes obtained by the two techniques are compared and discussed.